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CDCV304PW

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CDCV304PW
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Texas Instruments

General purpose and PCI-X 1:4 LVCMOS clock buffer 8-TSSOP -40 to 85

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¥24.8143
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生命周期状态: Active
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Adjacent Channel Power Ratio (ACPR) and Error Vector Magnitude (%EVM) Measurements
TIDA-00076: This reference design discusses the use of the TSW3085EVM with the TSW3100 pattern generator to test adjacent channel power ratio (ACPR) and error vector magnitude (EVM) measurements of LTE baseband signals. By using the TSW3100 LTE GUI, patterns are loaded into the TSW3085EVM which is comprised of the DAC3482, TRF3705, and LMK04806.
TIDA-00076 Adjacent Channel Power Ratio (ACPR) and Error Vector Magnitude (%EVM) Measurements | TI.com
TIDA-00076: This reference design discusses the use of the TSW3085EVM with the TSW3100 pattern generator to test adjacent channel power ratio (ACPR) and error vector magnitude (EVM) measurements of LTE baseband signals. By using the TSW3100 LTE GUI, patterns are loaded into the TSW3085EVM which is comprised of the DAC3482, TRF3705, and LMK04806.
Wideband Digital to RF Transmit Solution
TIDA-00072: The TSW308x is an example design of a wideband digital to RF transmit solution capable of generating 600 MHz of contiguous RF spectrum. The system provides a reference on how to use the DAC34x8x, TRF3705 IQ modulator and LMK0480x to achieve this. This reference EVM coupled with a pattern generator such as the TSW1400EVM can be used to arbitrarily generate narrow band and wideband signals at RF. Examples of configurations to generate standards compliant WCDMA test signals are provided.
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